X-ray optics and microanalysis : proceedings of the 20th international congress, Karlsruhe, Germany, 15-18 September 2009 /
editors, Melissa A. Denecke, Clive T. Walker ; sponsoring organizations, Research Center Karlsruhe (FZK)-Program NUCLEAR ... [et al.].
- Melville, N.Y. : American Institute of Physics, 2010.
- xiv, 214 p. : ill. ; 28 cm.
- AIP conference proceedings, 1221 0094-243X ; .
- AIP conference proceedings ; no. 1221. .
"All papers have been peer reviewed." "This book contains peer-reviewed proceeding contributions to the 20th International Congress on X-ray Optics and Microanalysis, ICXOM20, held in Karlsruhe, Germany, from the 15th to the 18th of September 2009"--P. ix.
Includes bibliographical references and index.
Advances in instrumentation, detection, and methodology -- X-ray optics monochromators and multilayers, focusing optics -- Quantitative and multivariate analysis -- Imaging techniques and image processing -- Applications of nano-, micro-, and surface analysis techniques.
9780735407640 0735407649
2011499270
X-ray optics--Congresses.
Materials--Microscopy--Congresses.
X-ray microanalysis--Congresses.
X-ray microscopes--Congresses.
TA1775 / .I582 2009
537.5352 / INI
"All papers have been peer reviewed." "This book contains peer-reviewed proceeding contributions to the 20th International Congress on X-ray Optics and Microanalysis, ICXOM20, held in Karlsruhe, Germany, from the 15th to the 18th of September 2009"--P. ix.
Includes bibliographical references and index.
Advances in instrumentation, detection, and methodology -- X-ray optics monochromators and multilayers, focusing optics -- Quantitative and multivariate analysis -- Imaging techniques and image processing -- Applications of nano-, micro-, and surface analysis techniques.
9780735407640 0735407649
2011499270
X-ray optics--Congresses.
Materials--Microscopy--Congresses.
X-ray microanalysis--Congresses.
X-ray microscopes--Congresses.
TA1775 / .I582 2009
537.5352 / INI