Computed electron micrographs and defect identification.
By A. K. Head, P. Humble, L. M. Clarebrough, a.o.
- Amsterdam, North-Holland Pub. Co., 1973.
- x, 400 p. with illus. 23 cm.
- Defects in crystalline solids, v. 7 .
Bibliography: p. [387]-389.
0444104623 (American Elsevier)
72093092
Ne73-47
Metals--Defects--Data processing.
Electron microscopy--Data processing.
QD921 / .C62
544.82 / HEC
Bibliography: p. [387]-389.
0444104623 (American Elsevier)
72093092
Ne73-47
Metals--Defects--Data processing.
Electron microscopy--Data processing.
QD921 / .C62
544.82 / HEC