Dhaka University Library Online catalog

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Siegel, Benjamin M., [from old catalog]

Modern developments in electron microscopy. - New York : Academic Press, 1964. - xii, 432 p. ; 24 cm.

LCCN: 63016977

Subjects--Topical Terms:
Electron microscopy.

LC Class. No.: 578.15 / SIM

Dewey Class. No.: 578.15 / SIM

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