Fault covering problems in reconfigurable VLSI systems /
by Ran Libeskind-Hadas ... [et al.].
- Boston : Kluwer, c1992.
- xiii, 130 p. : ill. ; 25 cm.
- The Kluwer international series in engineering and computer science ; VLSI, computer architecture, and digital signal processing SECS 172. .
- Kluwer international series in engineering and computer science ; SECS 172. Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing. .
Includes bibliographical references (p. 119-127) and index.
0792392310 (alk. paper)
92004369
Integrated circuits--Very large scale integration--Design and construction--Data processing.
Integrated circuits--Wafer-scale integration--Design and construction--Data processing.
Integrated circuits--Fault tolerance.
TK7874 / .F38 1992
621.395 / FAU
Includes bibliographical references (p. 119-127) and index.
0792392310 (alk. paper)
92004369
Integrated circuits--Very large scale integration--Design and construction--Data processing.
Integrated circuits--Wafer-scale integration--Design and construction--Data processing.
Integrated circuits--Fault tolerance.
TK7874 / .F38 1992
621.395 / FAU