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Davis, J. R. 1951-

Instabilities in MOS devices / J. R. Davis. - New York : Gordon and Breach Science Publishers, c1981. - xv, 175 p. : ill. ; 23 cm. - Electrocomponent science monographs ; v. 12 .

Includes bibliographical refererences (p. 151-175) and index.

0677055900

80025156


Metal oxide semiconductors.

TK7871.99.M44 / D38

621.38152 / A261i
Last Updated on September 15, 2019
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