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Schroder, Dieter K.

Semiconductor material and device characterization / Dieter K. Schroder. - New York : Wiley, c1990. - xv, 599 p. : ill. ; 25 cm.

"A Wiley-Interscience publication."

Includes bibliographical references and index.

ISBN: 0471511048

LCCN: 89024881

Subjects--Topical Terms:
Semiconductors.
Semiconductors--Testing.

LC Class. No.: QC611 / .S335 1990

Dewey Class. No.: 621.38152 / SCS

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