Selected papers on electronic speckle pattern interferometry : principles and practice /
Electronic speckle pattern interferometry
edited by Peter Meinlschmidt, Klaus D. Hinsch and Rajpal S. Sirohi.
- USA : SPIE Optical Engineering, c1996.
- xix, 524 p. : ill. ; 29 cm.
- SPIE milestone series ; v. MS 132 .
Includes bibliographical references and indexes.
0819423769 (alk. paper)
96036820
Holographic interferometry.
Speckle.
Nondestructive testing.
TA1555 / .S43 1996
621.3675 / SEL
Includes bibliographical references and indexes.
0819423769 (alk. paper)
96036820
Holographic interferometry.
Speckle.
Nondestructive testing.
TA1555 / .S43 1996
621.3675 / SEL