Speckle metrology /
edited by Rajpal S. Sirohi.
- New York : Dekker, c1993.
- xiii, 551 p. : ill. ; 24 cm.
- Optical engineering ; 38 .
- Optical engineering ; v. 38. .
Includes bibliographical references and index.
0824789326
93000734
Nondestructive testing.
Speckle metrology.
TA417.2 / .S66 1993
620.1127 / SPE
Includes bibliographical references and index.
0824789326
93000734
Nondestructive testing.
Speckle metrology.
TA417.2 / .S66 1993
620.1127 / SPE