Library Logo
Speckle metrology / edited by Rajpal S. Sirohi. - New York : Dekker, c1993. - xiii, 551 p. : ill. ; 24 cm. - Optical engineering ; 38 . - Optical engineering ; v. 38. .

Includes bibliographical references and index.

0824789326

93000734


Nondestructive testing.
Speckle metrology.

TA417.2 / .S66 1993

620.1127 / SPE
Last Updated on September 15, 2019
© Dhaka University Library. All Rights Reserved|Staff Login