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Egerton, R. F.

Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM / by Ray F. Egerton. - New York : Springer, c2005. - xii, 202 p. : ill. ; 25 cm.

Includes bibliographical references and index.

ISBN: 0387258000

LCCN: 2005924717

Subjects--Topical Terms:
Electron microscopy.

LC Class. No.: QH212.E4 / E354 2005

Dewey Class. No.: 502.825 / EGP

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