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Hosmer, David W.

Applied logistic regression / David W. Hosmer, Jr., Stanley Lemeshow. - New York : Wiley, c1989. - xiii, 307 p. ; 24 cm. - Wiley series in probability and mathematical statistics. Applied probability and statistics .

"A Wiley-Interscience publication."

Includes bibliographical references and index.

0471615536

89031893


Regression analysis.

QA278.2 / .H67 1989

519.536 / HOA
Last Updated on September 15, 2019
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