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A practical guide to optical metrology for thin films / (Record no. 206249)

000 -LEADER
fixed length control field 04154cam a2200685Ma 4500
001 - CONTROL NUMBER
control field ocn816311244
003 - CONTROL NUMBER IDENTIFIER
control field OCoLC
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20171113085140.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS
fixed length control field m o d
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr cnu||||||||
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 120622s2012 gw a ob 001 0 eng
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783527664344
Qualifying information (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 3527664343
Qualifying information (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783527664351
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 3527664351
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781299475991
Qualifying information (MyiLibrary)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 129947599X
Qualifying information (MyiLibrary)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783527664375
Qualifying information (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 3527664378
Qualifying information (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 3527411674
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 9783527411672
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 9783527664368
Qualifying information (mobi)
029 0# - OTHER SYSTEM CONTROL NUMBER (OCLC)
OCLC library identifier AU@
System control number 000050138801
029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC)
OCLC library identifier DEBBG
System control number BV041829500
029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC)
OCLC library identifier DEBBG
System control number BV041909974
029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC)
OCLC library identifier DEBSZ
System control number 431241112
029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC)
OCLC library identifier NZ1
System control number 14873616
029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC)
OCLC library identifier NZ1
System control number 15341083
035 ## - SYSTEM CONTROL NUMBER
System control number (OCoLC)816311244
Canceled/invalid control number (OCoLC)815392087
-- (OCoLC)840258022
-- (OCoLC)841172161
037 ## - SOURCE OF ACQUISITION
Stock number 478849
Source of stock number/acquisition MIL
040 ## - CATALOGING SOURCE
Original cataloging agency AU@
Language of cataloging eng
Description conventions pn
Transcribing agency AU@
Modifying agency CUS
-- OCLCQ
-- UIU
-- DG1
-- YDXCP
-- MHW
-- EBLCP
-- CDX
-- OCLCO
-- COO
-- IDEBK
-- MEAUC
-- OCLCQ
-- OCLCF
-- DEBSZ
-- N$T
-- E7B
-- DEBBG
-- OCLCQ
-- DG1
049 ## - LOCAL HOLDINGS (OCLC)
Holding library MAIN
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QC176.84.O7
Item number Q56 2012
072 #7 - SUBJECT CATEGORY CODE
Subject category code SCI
Source eflch
072 #7 - SUBJECT CATEGORY CODE
Subject category code SCI
Subject category code subdivision 024000
Source bisacsh
072 #7 - SUBJECT CATEGORY CODE
Subject category code SCI
Subject category code subdivision 041000
Source bisacsh
072 #7 - SUBJECT CATEGORY CODE
Subject category code SCI
Subject category code subdivision 055000
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 530.4/275
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Quinten, Michael.
245 12 - TITLE STATEMENT
Title A practical guide to optical metrology for thin films /
Statement of responsibility, etc. Michael Quinten.
Medium [electronic resource]
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc. Weinheim :
Name of publisher, distributor, etc. Wiley-VCH ;
Place of publication, distribution, etc. Chichester :
Name of publisher, distributor, etc. John Wiley [distributor],
Date of publication, distribution, etc. 2012.
300 ## - PHYSICAL DESCRIPTION
Extent 1 online resource :
Other physical details illustrations
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term online resource
Carrier type code cr
Source rdacarrier
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc Includes bibliographical references and index.
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Cover; Related Titles; Title Page; Copyright; Dedication; Preface; Chapter 1: Introduction; Chapter 2: Propagation of Light and Other Electromagnetic Waves; 2.1 Properties of Electromagnetic Waves; 2.2 Huygens-Fresnel Principle; 2.3 Interference of Electromagnetic Waves; 2.4 Reflection and Refraction; 2.5 Diffraction; 2.6 Scattering; 2.7 Dielectric Function and Refractive Index; Chapter 3: Spectral Reflectance and Transmittance of a Layer Stack; 3.1 Reflectance and Transmittance of a Single Layer; 3.2 Propagating Wave Model for a Layer Stack; Chapter 4: The Optical Measurement.
505 8# - FORMATTED CONTENTS NOTE
Formatted contents note 7.7 Measurement of Critical DimensionsNumerics with Complex Numbers; A.1 Addition; A.2 Multiplication; A.3 Modulus; A.4 Division; A.5 Power n; A.6 Logarithm; A.7 Exponentiation; A.8 Trigonometric Functions; Fourier Transform; B.1 Linearity; B.2 Scaling; B.3 Shifting; B.4 Damping; B.5 Convolution; B.6 Plancherel Theorem and Parseval's Theorem; Levenberg-Marquardt Algorithm; Downhill Simplex Algorithm; References; Index.
520 ## - SUMMARY, ETC.
Summary, etc. A one-stop, concise guide on determining and measuring thin film thickness by optical methods. This practical book covers the laws of electromagnetic radiation and interaction of light with matter, as well as the theory and practice of thickness measurement, and modern applications. In so doing, it shows the capabilities and opportunities of optical thickness determination and discusses the strengths and weaknesses of measurement devices along with their evaluation methods. Following an introduction to the topic, Chapter 2 presents the basics of the propagation of light and other electromag.
588 0# - SOURCE OF DESCRIPTION NOTE
Source of description note Print version record.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Thin films
General subdivision Optical properties.
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element SCIENCE
General subdivision Energy.
Source of heading or term bisacsh
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element SCIENCE
General subdivision Mechanics
-- General.
Source of heading or term bisacsh
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element SCIENCE
General subdivision Physics
-- General.
Source of heading or term bisacsh
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Thin films
General subdivision Optical properties.
Source of heading or term fast
Authority record control number (OCoLC)fst01150034
655 #4 - INDEX TERM--GENRE/FORM
Genre/form data or focus term Electronic books.
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Print version:
Main entry heading Quinten, Michael.
Title Practical guide to optical metrology for thin films.
Place, publisher, and date of publication Weinheim : Wiley-VCH ; Chichester : John Wiley [distributor], 2012
International Standard Book Number 9783527411672
Record control number (OCoLC)815367813
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://onlinelibrary.wiley.com/book/10.1002/9783527664344
Public note Wiley Online Library
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme
Koha item type Books

No items available.

Last Updated on September 15, 2019
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