Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications, and trends /
by Benninghoven, A; Rüdenauer, F. G; Werner, H. W.
Material type:
BookSeries: Chemical analysis ; v. 86. Publisher: New York : J. Wiley, 1987Description: xxxv, 1227 p. : ill. ; 24 cm.ISBN: 0471010561.Subject(s): Secondary ion mass spectrometryOnline resources: Publisher description | Table of Contents | Contributor biographical information
| Item type | Current location | Collection | Call number | Copy number | Status | Date due | Barcode |
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Books
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Dhaka University Science Library General Stacks | Non Fiction | 543.0873 BES (Browse shelf) | 1 | Available | 323096 |
"A Wiley-Interscience publication."
Includes index.
Bibliography: p. 1125-1216.
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