Includes bibliographical references and index.

Basics of Metrology and Introduction to Techniques / Andre Chrysochoos, Yves Surrel -- Photoelasticity / Fabrice Bremand, Jean-Christophe Dupre -- Grid Method, Moire and Deflectometry / Jerome Molimard, Yves Surrel -- Digital Holography Methods / Pascal Picart, Paul Smigielski -- Elementary Speckle Interferometry / Pierre Jacquot, Pierre Slangen, Dan Borza -- Digital Image Correlation / Michel Bornert, Francois Hild, Jean-Jose Orteu, Stephane Roux -- From Displacement to Strain / Pierre Feissel -- Introduction to Identification Methods / Marc Bonnet -- Parameter Identification from Mechanical Field Measurements using Finite Element Model Updating Strategies / Emmanuel Pagnacco, Anne-Sophie Caro-Bretelle, Patrick Ienny -- Constitutive Equation Gap / Stephane Pagano, Marc Bonnet -- Virtual Fields Method / Michel Grediac, Fabrice Pierron, Stephane Avril, Evelyne Toussaint, Marco Rossi -- Equilibrium Gap Method / Fabien Amiot, Jean-Noel Perie, Stephane Roux -- Reciprocity Gap Method / Stephane Andrieux, Huy Duong Bui, Andrei Constantinescu -- Characterization of Localized Phenomena / Jacques Desrues, Julien Rethore -- From Microstructure to Constitutive Laws / Jerome Crepin, Stephane Roux -- Thermographic Analysis of Material Behavior / Jean-Christophe Batsale, Andre Chrysochoos, Herve Pron, Bertrand Wattrisse.

Online resource; title from pdf information screen (Ebsco, viewed February 21, 2013).