Practical residual stress measurement methods / [electronic resource]
by Schajer, Gary S [editor.].
Material type:
BookPublisher: Chichester, West Sussex, United Kingdom : Wiley, 2013.Description: 1 online resource.ISBN: 9781118402825; 1118402820; 9781118402801; 1118402804; 9781118402818; 1118402812; 9781118402832; 1118402839; 1299804969; 9781299804968; 1118342372; 9781118342374.Subject(s): Residual stresses | TECHNOLOGY & ENGINEERING -- Quality Control | Residual stresses | Electronic booksOnline resources: Wiley Online Library Summary: "This comprehensive collection of practical residual stress measurement techniques is written by world-renowned experts in their respective fields. It provides the reader with the information needed to understand key concepts and to make informed technical decisions. Fully illustrated throughout, each chapter is written by invited specialists and presents chapters on hole-drilling and ring-coring, deep hole drilling, slitting, contour method measurements, X-ray/synchrotron/neutron diffraction, ultrasonics, Barkhausen noise and optical measurement techniques"-- Provided by publisher.Summary: "Practical Residual Stress Measurements provides the reader with the information needed to understand key concepts and to make informed technical decisions"-- Provided by publisher.
Includes bibliographical references and index.
"This comprehensive collection of practical residual stress measurement techniques is written by world-renowned experts in their respective fields. It provides the reader with the information needed to understand key concepts and to make informed technical decisions. Fully illustrated throughout, each chapter is written by invited specialists and presents chapters on hole-drilling and ring-coring, deep hole drilling, slitting, contour method measurements, X-ray/synchrotron/neutron diffraction, ultrasonics, Barkhausen noise and optical measurement techniques"-- Provided by publisher.
"Practical Residual Stress Measurements provides the reader with the information needed to understand key concepts and to make informed technical decisions"-- Provided by publisher.
Print version record and CIP data provided by publisher.
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