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Fringe pattern analysis for optical metrology : theory, algorithms, and applications / [electronic resource]

by Servín, Manuel [author.]; Quiroga, J. Antonio (Juan Antonio) [author.]; Padilla, J. Moisés (José Moisés) [author.].
Material type: materialTypeLabelBookPublisher: Weinheim : Wiley-VCH, [2014]Edition: First edition.Description: 1 online resource (xvi, 328 pages) : illustrations.ISBN: 1306840880; 9781306840880; 9783527681082; 3527681086; 3527411526; 9783527411528; 9783527681105 (ePub); 3527681108 (ePub).Subject(s): Interferometry | Diffraction patterns | Optical measurements | SCIENCE -- Energy | SCIENCE -- Mechanics -- General | SCIENCE -- Physics -- General | Diffraction patterns | Interferometry | Optical measurements | Interferometrie | Beugungsfigur | Electronic books | Electronic booksOnline resources: Wiley Online Library
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Includes bibliographical references and index.

Online resource; title from PDF title page (Wiley, viewed August 1, 2014).

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Last Updated on September 15, 2019
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