Scanning Probe Microscopy : atomic force microscopy and scanning tunneling microscopy /
by Voigtländer, Bert.
Material type:
BookSeries: Nanoscience and technology.Publisher: Berlin, Heidelberg : Springer, 2015.Description: xv, 382 p. : ill. (some col.) ; 24 cm.ISBN: 9783662452394 (hbk).Subject(s): Microscopies | Materials scienceSummary: This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
| Item type | Current location | Collection | Call number | Copy number | Status | Date due | Barcode |
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Books
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Dhaka University Science Library General Stacks | Non Fiction | 502.82 VOS (Browse shelf) | 1 | Available | 518017 | |
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Books
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Dhaka University Science Library General Stacks | Non Fiction | 502.82 VOS (Browse shelf) | 2 | Available | 518018 |
Includes bibliographical references and index.
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
Description based on publisher-supplied MARC data.
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