Accelerated testing : statistical models, test plans and data analyses /
by Nelson, Wayne.
Material type: BookSeries: Wiley series in probability and mathematical statisticsApplied probability and statistics. Publisher: New York : Wiley, c1990Description: xiv, 601 p. : ill. ; 25 cm.ISBN: 0471522775.Subject(s): Failure time data analysis | Reliability (Engineering) -- Statistical methods | Accelerated life testing -- Statistical methodsOnline resources: Contributor biographical information | Publisher description | Table of ContentsItem type | Current location | Collection | Call number | Copy number | Status | Date due | Barcode |
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Books | Dhaka University Science Library General Stacks | Non Fiction | 519.5 NEA (Browse shelf) | 1 | Available | 355647(D) | |
Books | Dhaka University Science Library General Stacks | Non Fiction | 519.5 NEA (Browse shelf) | 2 | Available | 355648 |
Browsing Dhaka University Science Library Shelves , Shelving location: General Stacks , Collection code: Non Fiction Close shelf browser
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519.5 NAU Understanding statistics / | 519.5 NEA Applied statistics / | 519.5 NEA Accelerated testing : | 519.5 NEA Accelerated testing : | 519.5 NEA Applied statistics / | 519.5 NES Statistics and probability in modern life / | 519.5 NEW New perspectives in theoretical and applied statistics / |
"A Wiley-Interscience publication."
Includes bibliographical references (p. 561-577).
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