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by Demel, John T; Miller, Michael J.
by Schneider, G. Michael; Bruell, Steven C.
by Washburn, K. (Kevin); Evans, J. T. (Jim T.).
by Yu, Ytha Y; Marut, Charles.
by Schildt, Herbert.
by Amsbury, Wayne.
by Schneider, G. Michael; Davis, Ronald; Mertz, Thomas.
by Anbarlian, Harry.
by Czap, Hans.
by Tangney, Brendan; O'Mahony, Donal.
by Sawatzky, Jasper J; Chen, Shu-Jen.
by Simpson, Alan; Simpson, Alan.
by Huizingh, Eelko.
by Brooks, Tom. -- BIS Applied Systems; Mackintosh International
by Turkle, Sherry.
by Tanenbaum, Andrew S.
by Metcalf, Michael; Reid, John Ker; Cohen, Malcolm.
by Woolfson, M. M; Pert, G. J. (Geoffrey J.).
by Thompson, Robert G. (Robert Glenn); Thompson, Robert G. (Robert Glenn).
by Frenkel, Daan; Smit, Berend.