Advances in X-ray analysis proceedings of the ... annual Conference on Application of X-ray Analysis.
by Conference on Application of X-ray Analysis.; JCPDS--International Centre for Diffraction Data.
Material type:
Continuing ResourceAnalytics: Show analyticsPublisher: Newtown Square, PA : International Centre for Diffraction Data Description: CD-ROMs ; 4 3/4 in.ISSN: 1097-0002.Subject(s): X-rays -- Industrial applications -- Congresses
| Item type | Current location | Collection | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
Books
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Dhaka University Science Library General Stacks | Non Fiction | 537.535 ADV (Browse shelf) | Available | A197134(D) |
Title from disk label.
Accompanied by index: Vol. 1-39 (1957-1995).
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