000 02743cas a2200673 a 4500
001 11140693
003 BD-DhUL
005 20140922105631.0
007 t|
008 760413c19419999nyu x 1 a0eng
010 _a 41003959
015 _a011312173
_2dnb
016 7 _a222105-6
_2DE-600
016 7 _a011134026
_2Uk
022 0 _a0091-9322
_l0091-9322
_21
030 _zIMCIAN
035 _a(OCoLC)ocm02109899
040 _aDLC
_cOKentU
_dNSDP
_dInU
_dDLC
_dOCoLC
_dNSDP
_dDLC
_dN
_dOCoLC
_dNST
_dInU
_dNST
_dInU
_dMCM
_dOCoLC
_dOrPS
_dNNC
_dNLGGC
_dCaQQL
_dOCoLC
_dHEBIS
_dGBVCP
_dDEBSZ
_dUKMGB
_dInU
_dBD-DhUL
042 _ansdp
_apcc
050 0 0 _aQC271
_b.A6
082 4 _a536.5
_bHET
210 0 _aTemperature
222 0 _aTemperature
245 0 0 _aTemperature :
_bits measurement and control in science and industry. Vol. 3, Part 2: Applied methods and instruments /
_cCharles M. Herzfeld (Editor-in-Chief)
260 _aNew York, N.Y. :
_bReinhold,
_c1962.
300 _av. :
_bill. ;
_c24-29 cm.
310 _aIrregular
362 1 _aBegan with: Vol. 1, published in 1941.
490 1 _aVol. <7- >: AIP conference proceedings,
_x0094-243X ;
_v<684- >
500 _aPapers presented at symposiums held under the auspices of the American Institute of Physics, National Bureau of Standards, Office of Ordnance Research, U.S. Army, Instrument Society of America, International Temperature Symposium and others.
500 _aImprint varies.
504 _aIncludes bibliographical references and index.
510 0 _aChemical abstracts
_x0009-2258
588 _aDescription based on: Vol. 3, published in 1962.
588 _aLatest issue consulted: Vol. 7, published in 2003.
590 _aSERBIB/SERLOC merged record
650 0 _aTemperature
_vCongresses.
650 0 _aTemperature measurements
_vCongresses.
650 1 7 _aTemperatuur.
_2gtt
650 1 7 _aMeettechniek.
_2gtt
650 1 7 _aExperimenteel onderzoek.
_2gtt
650 1 7 _aThermometrie.
_2gtt
650 6 _aTempérature
_vCollections.
650 6 _aThermométrie
_vCollections.
710 2 _aAmerican Institute of Physics.
710 1 _aUnited States.
_bNational Bureau of Standards.
710 1 _aUnited States.
_bOffice of Ordnance Research.
710 2 _aInstrument Society of America.
711 2 _aInternational Temperature Symposium.
776 0 8 _iOnline version:
_tTemperature
_w(OCoLC)609533376
830 0 _aAIP conference proceedings ;
_v<684- >.
850 _aAU
_aCU-RivA
_aCU-RivP
_aCaMWU
_aCaOWtU
_aCoU
_aDLC
_aInU
_aMCM
_aNhU
_aKyU
_aN
852 _xuniversal pattern
853 2 0 _81
_av.
_wx
863 4 1 _81.1
_a1
906 _a7
_bcbc
_cserials
_du
_encip
_f19
_gn-oclcserc
936 _aVol. 6, copyrighted in 1992 LIC
942 _2ddc
_cBK
999 _c12296
_d12296