| 000 | 00790cam a22002651 4500 | ||
|---|---|---|---|
| 001 | 6580472 | ||
| 003 | BD-DhUL | ||
| 005 | 20140923161354.0 | ||
| 008 | 740618s1964 nyua b 000 0 eng | ||
| 010 | _a 64020785 | ||
| 035 | _a(OCoLC)920922 | ||
| 040 |
_aDLC _cOU _dOCoLC _dDLC _dBD-DhUL |
||
| 042 | _apremarc | ||
| 050 | 0 | 0 |
_aTK3431 _b.M5 |
| 082 |
_a537.212 _bMIN |
||
| 100 | 1 |
_aMiller, Harold Nelson, _d1925- |
|
| 245 | 1 | 0 |
_aNondestructive high potential testing _c[by] Harold N. Miller. |
| 260 |
_aNew York, _bHayden Book Co. _c[1964] |
||
| 300 |
_ax, 148 p. _billus. _c22 cm. |
||
| 365 |
_aTK. _b33.00 |
||
| 504 | _aBibliography: p. 140-142. | ||
| 650 | 0 |
_aElectric insulators and insulation _xTesting. |
|
| 906 |
_a7 _bcbc _coclcrpl _du _encip _f19 _gy-gencatlg |
||
| 942 |
_2ddc _cBK |
||
| 999 |
_c12565 _d12565 |
||