000			01995cam a2200385 a 4500
001			16994592
003			BD-DhUL
005			20150204130452.0
008			111011s2010 nyua b 101 0 eng c
010			_a 2011499270
020			_a9780735407640
020			_a0735407649
035			_a(OCoLC)ocn624405748
040			_aYDXCP _cYDXCP _dYUS _dNTE _dPIT _dIQU _dDLC _dBD-DhUL
042			_apcc
050	0	0	_aTA1775 _b.I582 2009
082			_a537.5352 _bINI
111	2		_aInternational Congress on X-ray Optics and Microanalysis _n(20th : _d2009 : _cKarlsruhe, Germany)
245	1	0	_aX-ray optics and microanalysis : _bproceedings of the 20th international congress, Karlsruhe, Germany, 15-18 September 2009 / _ceditors, Melissa A. Denecke, Clive T. Walker ; sponsoring organizations, Research Center Karlsruhe (FZK)-Program NUCLEAR ... [et al.].
260			_aMelville, N.Y. : _bAmerican Institute of Physics, _c2010.
300			_axiv, 214 p. : _bill. ; _c28 cm.
490	1		_aAIP conference proceedings, _x0094-243X ; _v1221
500			_a"All papers have been peer reviewed."
500			_a"This book contains peer-reviewed proceeding contributions to the 20th International Congress on X-ray Optics and Microanalysis, ICXOM20, held in Karlsruhe, Germany, from the 15th to the 18th of September 2009"--P. ix.
504			_aIncludes bibliographical references and index.
505	0		_aAdvances in instrumentation, detection, and methodology -- X-ray optics monochromators and multilayers, focusing optics -- Quantitative and multivariate analysis -- Imaging techniques and image processing -- Applications of nano-, micro-, and surface analysis techniques.
650		0	_aX-ray optics _vCongresses.
650		0	_aMaterials _xMicroscopy _vCongresses.
650		0	_aX-ray microanalysis _vCongresses.
650		0	_aX-ray microscopes _vCongresses.
700	1		_aDenecke, Melissa A.
700	1		_aWalker, Clive T.
830		0	_aAIP conference proceedings ; _vno. 1221.
942			_2ddc _cBK
999			_c12639 _d12639