| 000 | 00807cam a2200253u 4500 | ||
|---|---|---|---|
| 001 | 8491446 | ||
| 003 | BD-DhUL | ||
| 005 | 20140924112832.0 | ||
| 008 | 820521s1968 nyua 000 0 eng | ||
| 010 | _a 68017577 | ||
| 040 |
_aDLC _cCarP _dDLC _dBD-DhUL |
||
| 050 | 0 | 0 |
_aTN686.5.M5 _bB4 |
| 082 |
_a537.56 _bBEE |
||
| 100 | 1 | _aBelk, J. A. [from old catalog] | |
| 245 | 1 | 0 |
_aElectron microscopy and microanalysis of metals / _cedited by J. A. Belk and A.L. Davies. |
| 260 |
_aAmsterdam : _bElsevier Pub. Co., _c1968. |
||
| 300 |
_aix, 254 p. : _c23 cm. _b illus. ; |
||
| 365 |
_aBDT _b165.00 |
||
| 500 | _aIncludes index. | ||
| 650 | 0 | _aElectron metallography. | |
| 700 | 1 |
_aDavies, A. L., [from old catalog] _ejoint author. |
|
| 906 |
_a0 _bcbc _cpremunv _du _encip _f19 _gy-gencatlg |
||
| 942 |
_2ddc _cBK |
||
| 999 |
_c12695 _d12695 |
||