000			01725cam a22003491 4500
001			2667546
003			BD-DhUL
005			20140924164131.0
008			840419m19611962njua b 100 0 eng c
010			_a 61012685 //r842
035			_a(OCoLC)ocm02834840
035			_a(NNC)2667546
040			_aDLC/ICU _cCGU _dOCL _dZCU _dBD-DhUL
050	0		_aTK7872.S4 _bS45
082	0		_a537.622 _bSHS
090			_aTK7872.S4 _bSe52
245	0	0	_aSemiconductor reliability / _cedited by John E. Shwop, Harold J. Sulivan.
260			_aElizabeth, N.J. : _bEngineering Publishers; trade distributors: Reinhold Pub. Corp., New York _cc1961.
300			_aix, 309 p.: _bill. ; _c22 cm.
365			_aUS$ _b8.50
500			_aVol. [1]: Based on the Conference on Reliability of Semiconductor Devices, 1961, sponsored by the Working Group on Semiconductor Devices, Advisory Group on Electron Tubes, Dept. of Defense. Edited by John E. Shwop [and] Harold J. Sullivan.
500			_aVol. 2: Based on the Conference on Reliability Assurance Techniques for Semiconductor Specifications, October 1961, Washington, D.C., sponsored by Aerospace Industries Association [and others] Edited by William H. Von Alven.
650		0	_aSemiconductors _xReliability _vCongresses.
700	1		_aShwop, John E., _eeditor.
700	1		_aVon Alven, William H., _eeditor.
710	1		_aUnited States. _bAdvisory Group on Electron Tubes.
710	2		_aAerospace Industries Association of America.
711	2		_aConference on Reliability of Semiconductor Devices _d(1961 : _cNew York, N.Y.)
711	2		_aConference on Reliability Assurance Techniques for Semiconductor Specifications _d(1961 : _cWashington, D.C.)
900			_aAUTH
942			_2ddc _cBK
999			_c12831 _d12831