| 000 | 01006cam a2200301 a 4500 | ||
|---|---|---|---|
| 001 | 563047 | ||
| 003 | BD-DhUL | ||
| 005 | 20140929120732.0 | ||
| 008 | 890412s1989 enka b 001 0 eng | ||
| 010 | _a 89007568 | ||
| 020 |
_a0852741472 : _c£55.00 (est.) |
||
| 040 |
_aDLC _cDLC _dDLC _dBD-DhUL |
||
| 050 | 0 | 0 |
_aTP156.S95 _bF47 1989 |
| 082 | 0 | 0 |
_a539.72112 _220 _bFEA |
| 100 | 1 | _aFerguson, I. F. | |
| 245 | 1 | 0 |
_aAuger microprobe analysis / _cI.F. Ferguson. |
| 260 |
_aNew York : _bA. Hilger, _cc1989. |
||
| 300 |
_ax, 456 p. : _bill. ; _c24 cm. |
||
| 365 |
_aGB _b93.00 |
||
| 504 | _aIncludes bibliographical references (p. [383]-430) and index. | ||
| 650 | 0 |
_aSurfaces (Technology) _xAnalysis. |
|
| 650 | 0 | _aAuger effect. | |
| 650 | 0 | _aPhotoelectron spectroscopy. | |
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy0745/89007568-d.html |
| 906 |
_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg |
||
| 942 |
_2ddc _cBK |
||
| 955 | _aCIP ver. yj03 04-28-97; yj42 05-19-97 | ||
| 999 |
_c13609 _d13609 |
||