000 | 01250cam a2200313 a 4500 | ||
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001 | 3561249 | ||
003 | BD-DhUL | ||
005 | 20141015095635.0 | ||
008 | 980623s1998 nyua b 001 0 eng | ||
010 | _a 98029986 | ||
020 | _a0824790391 (alk. paper) | ||
040 |
_aDLC _cDLC _dDLC _dBD-DhUL |
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050 | 0 | 0 |
_aQD506 _b.E44 1998 |
082 | 0 | 0 |
_a541.33 _221 _bELE |
245 | 0 | 0 |
_aElectrical phenomena at interfaces : _bfundamentals, measurements, and applications. |
250 |
_a2nd ed., rev. and expanded / _bedited by Hiroyuki Ohshima, Kunio Furusawa. |
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260 |
_aNew York : _bM. Dekker, _cc1998. |
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300 |
_axiii, 628 p. : _bill. ; _c26 cm. |
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440 | 0 |
_aSurfactant science series ; _vv. 76 |
|
504 | _aIncludes bibliographical references and index. | ||
650 | 0 | _aSurface chemistry. | |
650 | 0 | _aElectric double layer. | |
700 | 1 |
_aOhshima, Hiroyuki, _d1944- |
|
700 | 1 |
_aFurusawa, Kunio, _d1937- |
|
856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy0647/98029986-d.html |
906 |
_a7 _bcbu _corignew _d1 _eocip _f19 _gy-gencatlg |
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942 |
_2ddc _cBK |
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955 | _apc03 to ja00 06-23-98; jd20 to jk05 (for NARs) 06-24-98; jk05 to jd20 06-24-98; jd20 06-24-98; jd99 06-24-98; jd85 06-25-98; CIP ver. jc09 11-19-98 | ||
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_c14689 _d14689 |