000 00827pam a2200253 a 4500
001 1913474
003 BD-DhUL
005 20150309081608.0
008 850208s1985 nyua b 001 0 eng
010 _a 85003279
020 _a0471896349 :
_c$55.00 (est.)
040 _aDLC
_cDLC
_dDLC
_dBD-DhUL
050 0 0 _aQD139.T7
_bV35 1985
082 0 0 _a543
_219
_bv261s
100 1 _aVan Loon, J. C.
_q(Jon Clement),
_d1937-
245 1 0 _aSelected methods of trace metal analysis :
_bbiological and environmental samples /
_cJon C. Van Loon.
260 _aNew York :
_bWiley,
_cc1985.
300 _axix, 357 p. :
_bill. ;
_c24 cm.
365 _aUS$
_b66.60
490 0 _aChemical analysis,
_vv. 80
_x0069-2883 ;
504 _aIncludes bibliographical references and index.
650 0 _aTrace elements
_xAnalysis.
942 _2ddc
_cBK
999 _c15427
_d15427