000 01260cam a22003851 4500
001 2829209
003 BD-DhUL
005 20141022091654.0
008 681209s1968 nyua b 100 0 eng
010 _a 68013392
035 _a(OCoLC)ocm00400144
035 _a(NNC)2829209
040 _aDLC
_cDLC
_dNLM
_dOCL
_dZCU
_dBD-DhUL
050 0 0 _aQD95
_b.E28 1966
060 0 0 _aW3
_bPR9455 v.1 1966
060 1 4 _aQD 95
_bE13x 1966
082 0 0 _a545.83
_bOLX
099 _aQD
_a71
_a.P76
_av.1
111 2 _aEastern Analytical Symposium
_d(1966 :
_cNew York, N.Y.)
245 1 0 _aX-ray and electron methods of analysis.
_cEdited by H. Van Olphen and William Parrish.
260 _aNew York,
_bPlenum Press,
_c1968.
300 _ax, 164 p.
_billus.
_c24 cm.
490 1 _aProgress in analytical chemistry ;
_vv. 1
504 _aIncludes bibliographies.
650 0 _aX-ray spectroscopy.
650 0 _aX-ray crystallography.
650 2 _aSpectrum Analysis
_vCongresses.
650 2 _aX-Ray Diffraction
_vCongresses.
650 2 _aCrystallography
_vCongresses.
700 1 _aVan Olphen, H.,
_d1912-,
_eeditor.
700 1 _aParrish, William,
_d1914-,
_eeditor.
830 0 _aProgress in analytical chemistry ;
_vv. 1.
900 _aAUTH
942 _2ddc
_cBK
999 _c15760
_d15760