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| 003 | BD-DhUL | ||
| 005 | 20141027084337.0 | ||
| 008 | 750114s1973 ne a b 001 0 eng | ||
| 010 | _a 72093092 | ||
| 015 | _aNe73-47 | ||
| 020 | _a0444104623 (American Elsevier) | ||
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_aComputed electron micrographs and defect identification. _cBy A. K. Head, P. Humble, L. M. Clarebrough, a.o. |
| 260 |
_aAmsterdam, _bNorth-Holland Pub. Co., _c1973. |
||
| 300 |
_ax, 400 p. with illus. _c23 cm. |
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| 350 | _afl104.00 | ||
| 440 | 0 |
_aDefects in crystalline solids, _vv. 7 |
|
| 504 | _aBibliography: p. [387]-389. | ||
| 650 | 0 |
_aMetals _xDefects _xData processing. |
|
| 650 | 0 |
_aElectron microscopy _xData processing. |
|
| 700 | 1 | _aHead, A. K. | |
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