000 01370pam a2200337 a 4500
001 1652451
003 BD-DhUL
005 20170514152818.0
008 970401s1997 nyuabf b 001 0beng
010 _a 97014194
020 _a0471172103 (cloth : acidfree paper)
040 _aDLC
_cDLC
_dDLC
_dBD-DhUL
043 _an-us---
050 0 0 _aTS140.J87
_bB88 1997
082 0 0 _a658.50092
_221
_bBUJ
100 1 _aButman, John.
245 1 0 _aJuran :
_ba lifetime of influence /
_cJohn Butman.
260 _aNew York :
_bJohn Wiley,
_cc1997.
300 _aix, 260 p. :
_bill., maps ;
_c24 cm.
504 _aIncludes bibliographical references (p. 229-248) and index.
600 1 0 _aJuran, J. M.
_q(Joseph M.),
_d1904-2008.
650 0 _aIndustrial engineers
_zUnited States
_vBiography.
650 0 _aQuality control
_xHistory.
650 0 _aTotal quality management.
856 4 2 _3Contributor biographical information
_uhttp://www.loc.gov/catdir/bios/wiley041/97014194.html
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/description/wiley033/97014194.html
856 4 _3Table of Contents
_uhttp://www.loc.gov/catdir/toc/onix04/97014194.html
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2ddc
_cBK
955 _apc05 to la00 04-01-97; sc17 04-03-97 to ASCD; jf08 04-04-97 to SL; je05 to DDC 04-04-97; CIP ver. pv07 08-26-97
999 _c195815
_d195815