000			05553cam a2200709 i 4500
001			ocn879329842
003			OCoLC
005			20170612141709.0
006			m o d
007			cr |||||||||||
008			140505s2014 nju ob 001 0 eng
010			_a 2014017866
040			_aDLC _beng _erda _cDLC _dYDX _dN$T _dYDXCP _dEBLCP _dIDEBK _dOCLCF _dDG1 _dRECBK _dE7B _dDEBSZ _dUWO _dDG1
019			_a891400216 _a961536162 _a962611421
020			_a9781118916773 (epub)
020			_a1118916778 (epub)
020			_a9781118916766 (pdf)
020			_a111891676X (pdf)
020			_z9781118480489 (hardback)
020			_a9781118916780
020			_a1118916786
029	1		_aAU@ _b000052810013
029	1		_aCHVBK _b325941467
029	1		_aCHBIS _b010259806
029	1		_aNZ1 _b15909356
029	1		_aDEBSZ _b431751781
035			_a(OCoLC)879329842 _z(OCoLC)891400216 _z(OCoLC)961536162 _z(OCoLC)962611421
042			_apcc
050		0	_aQD96.S43
072		7	_aSCI _x013010 _2bisacsh
082	0	0	_a543/.65 _223
084			_aSCI013010 _2bisacsh
049			_aMAIN
100	1		_aVan der Heide, Paul, _d1962- _eauthor.
245	1	0	_aSecondary ion mass spectrometry : _ban introduction to principles and practices / _cP.A.W. van der Heide.
264		1	_aHoboken, New Jersey : _bWiley, _c[2014]
300			_a1 online resource.
336			_atext _2rdacontent
337			_acomputer _2rdamedia
338			_aonline resource _2rdacarrier
504			_aIncludes bibliographical references and index.
520			_a"This is presented in a concise yet comprehensive manner to those wanting to know more about the technique in general as opposed to advanced sample specific procedures/applications"-- _cProvided by publisher.
500			_aMachine generated contents note: Forward x Preface xi Acknowledgements xiv List of physical constants xiv Chapter 1: Introduction 1.1 Matter and the Mass Spectrometer 1.2 Secondary Ion Mass Spectrometry 1.3 Summary Section I Chapter 2: Properties of atoms, ions, molecules and solids 2.1 The Atom 2.2 Electronic structure of atoms and ions 2.3 Summary Chapter 3: Current understanding of sputtering and ion formation 3.1 The fundamentals of SIMS 3.2 Sputtering 3.3 Ionization/neutralization 3.4 Summary Section II Chapter 4: Instrumentation 4.1 The science of measurement 4.2 Hardware 4.3 Summary Chapter 5: Data collection 5.1 The art of measurement 5.2 Sample preparation and handling 5.3 Data collection 5.4 Data conversion 5.5 Summary Appendix i) Periodic table of the elements ii) Isotope masses, natural isotope abundances, atomic weights and mass densities of the elements iii) 1st and 2nd Ionization potentials and electron affinities of the elements iv) Work-functions of elemental solids v) SIMS detection limits of selected elements vi) Charged particle beam transport vii) Statistical properties viii) SIMS instrument designs ix) Additional SIMS methods of interest x) Additional spectrometric/spectroscopic techniques xi) Additional microscopic techniques xii) Diffraction / reflection techniques Technique acronym list Abbreviations commonly used in SIMS Glossary of terms Questions and answers References Index Notes .
588			_aDescription based on print version record and CIP data provided by publisher.
505	0		_aChapter 1. Introduction: 1.1 Matter and the Mass Spectrometer ; 1.2 Secondary Ion Mass Spectrometry ; 1.3 Summary -- Chapter 2. Properties of atoms, ions, molecules and solids: 2.1 The Atom ; 2.2 Electronic structure of atoms and ions -- Chapter 3. Current understanding of sputtering and ion formation: 3.1 The fundamentals of SIMS ; 3.2 Sputtering ; 3.3 Ionization/neutralization ; 3.4 Summary -- Chapter 4. Instrumentation: 4.1 The science of measurement ; 4.2 Hardware -- Chapter 5. Data collection: 5.1 The art of measurement ; 5.2 Sample preparation and handling ; 5.3 Data collection ; 5.4 Data conversion -- Appendix i) Periodic table of the elements ; ii) Isotope masses, natural isotope abundances, atomic weights and mass densities of the elements ; iii) 1st and 2nd Ionization potentials and electron affinities of the elements ; iv) Work-functions of elemental solids ; v) SIMS detection limits of selected elements ; vi) Charged particle beam transport ; vii) Statistical properties ; viii) SIMS instrument designs ; ix) Additional SIMS methods of interest ; x) Additional spectrometric/spectroscopic techniques ; xi) Additional microscopic techniques ; xii) Diffraction / reflection techniques -- Technique acronym list -- Abbreviations commonly used in SIMS.
650		0	_aSecondary ion mass spectrometry.
650		7	_aSCIENCE / Chemistry / Analytic. _2bisacsh
650		7	_aSecondary ion mass spectrometry. _2fast _0(OCoLC)fst01110604
655		4	_aElectronic books.
655		0	_aElectronic books.
776	0	8	_iPrint version: _aVan der Heide, Paul, 1962- author. _tSecondary ion mass spectrometry _dHoboken, New Jersey : John Wiley & Sons, Inc., [2014] _z9781118480489 _w(DLC) 2014011448
856	4	0	_uhttp://onlinelibrary.wiley.com/book/10.1002/9781118916780 _zWiley Online Library
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999			_c207419 _d207419