| 000 | 01303cam a2200325 a 4500 | ||
|---|---|---|---|
| 001 | 1655998 | ||
| 003 | BD-DhUL | ||
| 005 | 20150115141455.0 | ||
| 008 | 971216s1998 nyua b 001 0 eng | ||
| 010 | _a 97052094 | ||
| 020 | _a0471241393 (cloth : alk. paper) | ||
| 040 |
_aDLC _cDLC _dDLC _dBD-DhUL |
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| 050 | 0 | 0 |
_aQC611 _b.S335 1998 |
| 082 | 0 | 0 |
_a621.38152 _221 _bSCS |
| 100 | 1 | _aSchroder, Dieter K. | |
| 245 | 0 | 0 |
_aSemiconductor material and device characterization / _cDieter K. Schroder. |
| 250 | _a2nd ed. | ||
| 260 |
_aNew York : _bWiley, _cc1998. |
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| 300 |
_axxiv, 760 p. : _bill. ; _c25 cm. |
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| 365 |
_aUS$ _b124.95 |
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| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 | _aSemiconductors. | |
| 650 | 0 |
_aSemiconductors _xTesting. |
|
| 856 | 4 | 2 |
_3Contributor biographical information _uhttp://www.loc.gov/catdir/bios/wiley047/97052094.html |
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/description/wiley032/97052094.html |
| 856 | 4 |
_3Table of Contents _uhttp://www.loc.gov/catdir/toc/onix02/97052094.html |
|
| 906 |
_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg |
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| 942 |
_2ddc _cBK |
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| 955 | _apc05 to ja00 12-16-97; jf06 to subj 12-16-97; jf08 12-18-97 CIP to PHys II (QC); 18Dec97 JE08 to SL; je05 to DDC 12-18-97; CIP ver. jc09 07-08-98 | ||
| 999 |
_c31624 _d31624 |
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