| 000 | 01498cam a2200385 a 4500 | ||
|---|---|---|---|
| 001 | 13936063 | ||
| 003 | BD-DhUL | ||
| 005 | 20150115143650.0 | ||
| 008 | 050420s2006 njua b 001 0 eng | ||
| 010 | _a 2005048514 | ||
| 015 |
_aGBA573304 _2bnb |
||
| 016 | 7 |
_a013282982 _2Uk |
|
| 020 | _a0471739065 (acidfree paper) | ||
| 020 | _a9780471739067 | ||
| 035 | _a(OCoLC)ocm59360243 | ||
| 040 |
_aDLC _cDLC _dBAKER _dUKM _dC#P _dDLC _dBD-DhUL |
||
| 050 | 0 | 0 |
_aQC611 _b.S335 2006 |
| 082 | 0 | 0 |
_a621.38152 _bSCS |
| 100 | 1 | _aSchroder, Dieter K. | |
| 245 | 1 | 0 |
_aSemiconductor material and device characterization / _cDieter K. Schroder. |
| 250 | _a3rd ed. | ||
| 260 |
_a[Piscataway : _bWiley, _cc2006. |
||
| 300 |
_axv, 779 p. : _bill. ; _c24 cm. |
||
| 365 |
_aGBP. _b70.15 |
||
| 500 | _a"Wiley-Interscience." | ||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 | _aSemiconductors. | |
| 650 | 0 |
_aSemiconductors _xTesting. |
|
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy0645/2005048514-d.html |
| 856 | 4 | 1 |
_3Table of contents only _uhttp://www.loc.gov/catdir/enhancements/fy0645/2005048514-t.html |
| 856 | 4 | 2 |
_3Contributor biographical information _uhttp://www.loc.gov/catdir/enhancements/fy0654/2005048514-b.html |
| 906 |
_a7 _bcbc _corignew _d1 _eocip _f20 _gy-gencatlg |
||
| 942 |
_2ddc _cBK |
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| 955 |
_apc12 2005-04-20 to ASCD _ijp18 2005-04-21 to SL _aaa01 2005-04-21 _aps10 2006-03-02 bk rec'd, to CIP ver. _apv12 2006-08-09 copy 2 to BCCD |
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| 999 |
_c31652 _d31652 |
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