000 00804cam a22002651 4500
001 2667681
003 BD-DhUL
005 20150115173703.0
008 740625s1967 nyua b 000 0 eng
010 _a 66028633
015 _aGB67-24704
035 _a(OCoLC)ocm02118269
040 _aBD-DhUL
_cBD-DhUL
_dOCL
_dUKM
_dZCU
050 0 _aTK7874
_b.S3
082 _a621.3815
_bSCI
245 1 0 _aIntegrated circuit technology :
_binstrumentation and techniques, for measurement, process and failure analysis /
_ced. by Seymour Schwartz
260 _aNew York :
_bMcGraw-Hill,
_c1967.
300 _axv, 340 p. :
_bill. ;
_c26 cm.
365 _aTK
_b135.00
500 _aincludes index.
504 _aIncludes bibliographies.
650 0 _aIntegrated circuits.
900 _aAUTH
942 _2ddc
_cBK
999 _c31872
_d31872