000 01053pam a2200289 a 4500
001 1106621
003 BD-DhUL
005 20150117140905.0
008 930409s1994 nyua f 001 0 eng
010 _a 93019595
020 _a0070376026 (H) :
_c$39.50
040 _aDLC
_cDLC
_dDLC
_dBD-DhUL
050 0 0 _aTK7878.4
_b.L4514 1994
082 0 0 _a621.380287
_bLEM
100 1 _aLenk, John D.
245 1 0 _aMcGraw-Hill electronic testing handbook :
_bprocedures and techniques /
_cJohn D. Lenk.
260 _aNew York :
_bMcGraw-Hill,
_cc1994.
300 _axvii, 397 p. :
_bill. ;
_c24 cm.
365 _aUS$.
_b17.95
500 _aIncludes index.
650 0 _aElectronic instruments
_xHandbooks, manuals, etc.
650 0 _aElectronic apparatus and appliances
_xTesting
_xHandbooks, manuals, etc.
740 0 _aElectronic testing handbook.
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2ddc
_cBK
955 _apc18 to ja00 04-09-93; jg05 04-12-93; jg12 04-12-93; to CPSO; jg08 04-13-93; aa21 04-15-93; CIP ver. jg06 12-07-93
999 _c32054
_d32054