000 01267cam a2200337 a 4500
001 3999471
003 BD-DhUL
005 20150118170552.0
008 960930s1996 waua b 001 0 eng
010 _a 96036820
020 _a0819423769 (alk. paper)
040 _aDLC
_cDLC
_dDLC
_dBD-DhUL
050 0 0 _aTA1555
_b.S43 1996
082 0 0 _a621.3675
_221
_bSEL
245 0 0 _aSelected papers on electronic speckle pattern interferometry :
_bprinciples and practice /
_cedited by Peter Meinlschmidt, Klaus D. Hinsch and Rajpal S. Sirohi.
246 3 0 _aElectronic speckle pattern interferometry
260 _aUSA :
_bSPIE Optical Engineering,
_cc1996.
300 _axix, 524 p. :
_bill. ;
_c29 cm.
365 _aUS$
_b110.00
490 _aSPIE milestone series ;
_vv. MS 132
504 _aIncludes bibliographical references and indexes.
650 0 _aHolographic interferometry.
650 0 _aSpeckle.
650 0 _aNondestructive testing.
700 1 _aMeinlschmidt, Peter,
_d1960-
700 1 _aHinsch, K. D.
_q(Klaus D.),
_d1941-
700 1 _aSirohi, R. S.
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2ddc
_cBK
955 _apc05 to ja00 09-30-96;jf05 to subj. 10/01/96; jf08 10-01-96 to SL;jf12 10-02-96; CIP ver. pv07 02-12-97
999 _c32942
_d32942