| 000 | 00809pam a2200277 a 4500 | ||
|---|---|---|---|
| 001 | 1577077 | ||
| 003 | BD-DhUL | ||
| 005 | 20150504092652.0 | ||
| 008 | 930225s1993 nyua b 001 0 eng | ||
| 010 | _a 93000734 | ||
| 020 | _a0824789326 | ||
| 040 |
_aBD-DhUL _cBD-DhUL _dDLC |
||
| 050 | 0 | 0 |
_aTA417.2 _b.S66 1993 |
| 082 | 0 | 0 |
_a620.1127 _220 _bSPE |
| 245 | 0 | 0 |
_aSpeckle metrology / _cedited by Rajpal S. Sirohi. |
| 260 |
_aNew York : _bDekker, _cc1993. |
||
| 300 |
_axiii, 551 p. : _bill. ; _c24 cm. |
||
| 365 |
_aUSD _b210.00 |
||
| 490 | 1 |
_aOptical engineering ; _v38 |
|
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 | _aNondestructive testing. | |
| 650 | 0 | _aSpeckle metrology. | |
| 700 | 1 |
_aSirohi, R. S. _eed. |
|
| 830 | 0 |
_aOptical engineering ; _vv. 38. |
|
| 942 |
_2ddc _cBK |
||
| 999 |
_c33009 _d33009 |
||