000 01325cam a22003617a 4500
001 13627023
003 BD-DhUL
005 20150118184424.0
008 040617s2005 gw a b 001 0 eng
010 _a 2004109048
015 _aGBA458062
_2bnb
016 7 _a012967852
_2Uk
020 _a3540224521
035 _a(CStRLIN)CUBGGLAD185397152-B
035 _a(CU)GLAD185397152
040 _a*UKM*
_c*UKM*
_dHkUST
_d*C#P*
_dCU
_dCStRLIN
_dDLC
_dBD-DhUL
042 _alccopycat
050 0 0 _aT174.7
_b.N37327 2005
082 0 0 _a620.5
_222
_bNAN
245 0 0 _aNanotechnology and nanoelectronics :
_bmaterials, devices, measurement techniques /
_cedited by W.R. Fahrner.
260 _aNew York :
_bSpringer-Verlag,
_cc2005.
300 _axvi, 269 p. :
_bill. ;
_c24 cm.
365 _aRS
_b695.00
504 _aIncludes bibliographical references (p. [239]-260) and index.
650 0 _aNanotechnology.
700 1 _aFahrner, W. R.
_q(Wolfgang R.)
856 4 1 _3Table of contents
_uhttp://www.loc.gov/catdir/toc/fy054/2004109048.html
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy0816/2004109048-d.html
906 _a7
_bcbc
_ccopycat
_d2
_eepcn
_f20
_gy-gencatlg
942 _2ddc
_cBK
955 _ajf07 2005-07-08 z-processor
_ijf07 2005-07-08
_aaa07 2005-07-26
955 _apc17 2004-06-17
999 _c33044
_d33044