000 01707cam a2200385 a 4500
001 2615776
003 BD-DhUL
005 20150123180634.0
008 980611s1999 nyua b 001 0 eng
010 _a 98027511
020 _a0471154105 (cloth : alk. paper)
040 _aDLC
_cDLC
_dDLC
_dBD-DhUL
050 0 0 _aR853.S7
_bH67 1999
082 0 0 _a610.727
_221
_bHOA
100 1 _aHosmer, David W.
245 1 0 _aApplied survival analysis :
_bregression modeling of time to event data /
_cDavid W. Hosmer, Jr. and Stanley Lemeshow.
260 _aNew York :
_bJohn Wiley & Sons,
_cc1999.
300 _axiii, 386 p. :
_bill. ;
_c24 cm.
365 _aUS$
_b84.95
440 0 _aWiley series in probability and statistics.
_pTexts and references section
500 _a"A Wiley-Interscience publication."
504 _aIncludes bibliographical references (p. 365-377) and index.
650 0 _aMedicine
_xResearch
_xStatistical methods.
650 0 _aMedical sciences
_xStatistical methods
_xComputer programs.
650 0 _aRegression analysis
_xData processing.
650 0 _aPrognosis
_xStatistical methods.
650 0 _aLogistic distribution.
700 1 _aLemeshow, Stanley.,
_ejoint author.
856 4 2 _3Contributor biographical information
_uhttp://www.loc.gov/catdir/bios/wiley046/98027511.html
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/description/wiley0310/98027511.html
856 4 _3Table of Contents
_uhttp://www.loc.gov/catdir/toc/onix03/98027511.html
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2ddc
_cBK
955 _apc14 to ja00 06-12-98; jd25 06-12-98; jd99 to jc00 (R?) 06-16-98; jc15 06-18-98; jc03 06-18-98; CIP ver. jb11 03-09-99
999 _c35698
_d35698