000 01504pam a2200361 a 4500
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003 BD-DhUL
005 20140819091829.0
008 950914r19951993nyua b 001 0 eng
010 _a 95039017
020 _a0195107519 (acidfree paper)
020 _a9780195107517
040 _aDLC
_cDLC
_dDLC
_dBD-DhUL
050 0 0 _aQH212.S3
_bF58 1995
082 0 0 _a502.825
_220
_bFLS
100 1 _aFlegler, Stanley L.
245 1 0 _aScanning and transmission electron microscopy :
_ban introduction /
_cby Stanley L. Flegler, John W. Heckman, Jr. and Karen L. Klomparens.
260 _aNew York :
_bOxford University Press,
_c1993.
300 _aviii, 225 p. :
_bill. ;
_c26 cm.
365 _aUS$
_b74.65
500 _aOriginally published: New York : W.H. Freeman, c1993.
504 _aIncludes bibliographical references and index.
650 0 _aScanning electron microscopy.
650 0 _aTransmission electron microscopy.
700 1 _aHeckman, John William.
700 1 _aKlomparens, Karen L.
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy0603/95039017-d.html
856 4 1 _3Table of contents only
_uhttp://www.loc.gov/catdir/enhancements/fy0603/95039017-t.html
856 4 2 _3Contributor biographical information
_uhttp://www.loc.gov/catdir/enhancements/fy0723/95039017-b.html
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2ddc
_cBK
955 _apc14 to ja00 09-14-95; jb09 09-14-95;jb02 09-15-95; CIP ver. pv08 09-09-96
999 _c3829
_d3829