000 01405cam a2200325 a 4500
001 1164262
003 BD-DhUL
005 20140909101221.0
008 960827s1997 nyua b 001 0 eng
010 _a 96041105
020 _a0824782488 (alk. paper)
040 _aDLC
_cDLC
_dDLC
_dBD-DhUL
050 0 0 _aQA278
_b.V66 1997
082 0 0 _a519.535
_220
_bVOL
100 1 _aVonesh, Edward F.,
_d1952-
245 1 0 _aLinear and nonlinear models for the analysis of repeated measurements /
_cEdward F. Vonesh, Vernun M. Chinchilli.
260 _aNew York :
_bM. Dekker,
_cc1997.
300 _axii, 560 p. :
_bill. ;
_c24 cm. +
_e1 computer disk (3 1/2 in.)
365 _aUS$
_b125.75
490 0 _aStatistics, textbooks and monographs ;
_vv. 154
504 _aIncludes bibliographical references and indexes.
538 _aSystem requirements for accompanying computer disk: Program written using SAS, tested on IBM PS/2; may run on any PC or mainframe under DOS, Windows, or OS/2 with access to SAS.
650 0 _aMultivariate analysis.
650 0 _aExperimental design.
700 1 _aChinchilli, Vernon M.,
_d1952-
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy0647/96041105-d.html
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2ddc
_cBK
955 _apc19 to ja00 08-28-96; jd20 08-29-96; jd99 08-29-96; jd11 08-30-96; CIP ver. pv08 02-27-97
999 _c8991
_d8991