| 000 | 01367cam a2200337 a 4500 | ||
|---|---|---|---|
| 001 | 4344893 | ||
| 003 | BD-DhUL | ||
| 005 | 20140909103757.0 | ||
| 008 | 890915s1990 nyua b 001 0 eng | ||
| 010 | _a 89024853 | ||
| 020 | _a0471522775 | ||
| 040 |
_aDLC _cDLC _dDLC _dBD-DhUL |
||
| 050 | 0 | 0 |
_aQA276 _b.N45 1990 |
| 082 | 0 | 0 |
_a519.5 _220 _bNEA |
| 100 | 1 |
_aNelson, Wayne, _d1936- |
|
| 245 | 1 | 0 |
_aAccelerated testing : _bstatistical models, test plans and data analyses / _cWayne Nelson. |
| 260 |
_aNew York : _bWiley, _cc1990. |
||
| 300 |
_axiv, 601 p. : _bill. ; _c25 cm. |
||
| 365 |
_aUSD _b100.75 |
||
| 440 | 0 |
_aWiley series in probability and mathematical statistics. _pApplied probability and statistics |
|
| 500 | _a"A Wiley-Interscience publication." | ||
| 504 | _aIncludes bibliographical references (p. 561-577). | ||
| 650 | 0 | _aFailure time data analysis. | |
| 650 | 0 |
_aReliability (Engineering) _xStatistical methods. |
|
| 650 | 0 |
_aAccelerated life testing _xStatistical methods. |
|
| 856 | 4 | 2 |
_3Contributor biographical information _uhttp://www.loc.gov/catdir/bios/wiley047/89024853.html |
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/description/wiley031/89024853.html |
| 856 | 4 |
_3Table of Contents _uhttp://www.loc.gov/catdir/toc/onix01/89024853.html |
|
| 906 |
_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg |
||
| 942 |
_2ddc _cBK |
||
| 999 |
_c9030 _d9030 |
||