Birkholz, Mario.
Thin film analysis by X-ray scattering / Mario Birkholz with contributions by Paul F. Fewster, Christoph Genzel. - Weinheim : Wiley-VCH, c2006. - xxii, 356 p. : ill. ; 25 cm.
Includes bibliographical references and index.
3527310525 9783527310524
2006482582
013206703 Uk
Thin films.
X-ray spectroscopy.
QC176.83 / .B57 2006
530.4275 / BIT
Thin film analysis by X-ray scattering / Mario Birkholz with contributions by Paul F. Fewster, Christoph Genzel. - Weinheim : Wiley-VCH, c2006. - xxii, 356 p. : ill. ; 25 cm.
Includes bibliographical references and index.
3527310525 9783527310524
2006482582
013206703 Uk
Thin films.
X-ray spectroscopy.
QC176.83 / .B57 2006
530.4275 / BIT