Thin film analysis by X-ray scattering /
by Birkholz, Mario; Fewster, Paul F; Genzel, Christoph.
Material type:
BookPublisher: Weinheim : Wiley-VCH, c2006Description: xxii, 356 p. : ill. ; 25 cm.ISBN: 3527310525; 9783527310524.Subject(s): Thin films | X-ray spectroscopyOnline resources: Contributor biographical information | Publisher description | Table of contents only
| Item type | Current location | Collection | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
Books
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Dhaka University Science Library General Stacks | Non Fiction | 530.4275 BIT (Browse shelf) | Available | 451078 |
Includes bibliographical references and index.
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