Semiconductor reliability /
edited by John E. Shwop, Harold J. Sulivan.
- Elizabeth, N.J. : Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York c1961.
- ix, 309 p.: ill. ; 22 cm.
Vol. [1]: Based on the Conference on Reliability of Semiconductor Devices, 1961, sponsored by the Working Group on Semiconductor Devices, Advisory Group on Electron Tubes, Dept. of Defense. Edited by John E. Shwop [and] Harold J. Sullivan. Vol. 2: Based on the Conference on Reliability Assurance Techniques for Semiconductor Specifications, October 1961, Washington, D.C., sponsored by Aerospace Industries Association [and others] Edited by William H. Von Alven.
61012685 //r842
Semiconductors--Reliability--Congresses.
TK7872.S4 / S45
537.622 / SHS
Vol. [1]: Based on the Conference on Reliability of Semiconductor Devices, 1961, sponsored by the Working Group on Semiconductor Devices, Advisory Group on Electron Tubes, Dept. of Defense. Edited by John E. Shwop [and] Harold J. Sullivan. Vol. 2: Based on the Conference on Reliability Assurance Techniques for Semiconductor Specifications, October 1961, Washington, D.C., sponsored by Aerospace Industries Association [and others] Edited by William H. Von Alven.
61012685 //r842
Semiconductors--Reliability--Congresses.
TK7872.S4 / S45
537.622 / SHS