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Semiconductor reliability / (Record no. 12831)

000 -LEADER
fixed length control field	01725cam a22003491 4500
001 - CONTROL NUMBER
control field	2667546
003 - CONTROL NUMBER IDENTIFIER
control field	BD-DhUL
005 - DATE AND TIME OF LATEST TRANSACTION
control field	20140924164131.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field	840419m19611962njua b 100 0 eng c
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
LC control number	61012685 //r842
035 ## - SYSTEM CONTROL NUMBER
System control number	(OCoLC)ocm02834840
035 ## - SYSTEM CONTROL NUMBER
System control number	(NNC)2667546
040 ## - CATALOGING SOURCE
Original cataloging agency	DLC/ICU
Transcribing agency	CGU
Modifying agency	OCL
--	ZCU
--	BD-DhUL
050 0# - LIBRARY OF CONGRESS CALL NUMBER
Classification number	TK7872.S4
Item number	S45
082 0# - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number	537.622
Item number	SHS
090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN)
Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR)	TK7872.S4
Local cutter number (OCLC) ; Book number/undivided call number, CALL (RLIN)	Se52
245 00 - TITLE STATEMENT
Title	Semiconductor reliability /
Statement of responsibility, etc.	edited by John E. Shwop, Harold J. Sulivan.
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc.	Elizabeth, N.J. :
Name of publisher, distributor, etc.	Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York
Date of publication, distribution, etc.	c1961.
300 ## - PHYSICAL DESCRIPTION
Extent	ix, 309 p.:
Other physical details	ill. ;
Dimensions	22 cm.
365 ## - TRADE PRICE
Price type code	US$
Price amount	8.50
500 ## - GENERAL NOTE
General note	Vol. [1]: Based on the Conference on Reliability of Semiconductor Devices, 1961, sponsored by the Working Group on Semiconductor Devices, Advisory Group on Electron Tubes, Dept. of Defense. Edited by John E. Shwop [and] Harold J. Sullivan.
500 ## - GENERAL NOTE
General note	Vol. 2: Based on the Conference on Reliability Assurance Techniques for Semiconductor Specifications, October 1961, Washington, D.C., sponsored by Aerospace Industries Association [and others] Edited by William H. Von Alven.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element	Semiconductors
General subdivision	Reliability
Form subdivision	Congresses.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name	Shwop, John E.,
Relator term	editor.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name	Von Alven, William H.,
Relator term	editor.
710 1# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element	United States.
Subordinate unit	Advisory Group on Electron Tubes.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element	Aerospace Industries Association of America.
711 2# - ADDED ENTRY--MEETING NAME
Meeting name or jurisdiction name as entry element	Conference on Reliability of Semiconductor Devices
Date of meeting	(1961 :
Location of meeting	New York, N.Y.)
711 2# - ADDED ENTRY--MEETING NAME
Meeting name or jurisdiction name as entry element	Conference on Reliability Assurance Techniques for Semiconductor Specifications
Date of meeting	(1961 :
Location of meeting	Washington, D.C.)
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme
Koha item type	Books

Holdings
Price effective from	Date last seen	Permanent Location	Not for loan	Date acquired	Source of classification or shelving scheme	Koha item type	Lost status	Withdrawn status	Source of acquisition	Collection code	Damaged status	Shelving location	Barcode	Current Location	Full call number
2014-09-24	2014-09-24	Dhaka University Science Library		1962-06-01		Books			Purchased	Non Fiction		General Stacks	A20559	Dhaka University Science Library	537.622 SHS

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Semiconductor reliability / (Record no. 12831)