X-ray optics and microanalysis : proceedings of the 20th international congress, Karlsruhe, Germany, 15-18 September 2009 /
by (20th : International Congress on X-ray Optics and Microanalysis 2009 : Karlsruhe, Germany); Denecke, Melissa A; Walker, Clive T.
Material type:
BookSeries: AIP conference proceedings: no. 1221.Publisher: Melville, N.Y. : American Institute of Physics, 2010Description: xiv, 214 p. : ill. ; 28 cm.ISBN: 9780735407640; 0735407649.Subject(s): X-ray optics -- Congresses | Materials -- Microscopy -- Congresses | X-ray microanalysis -- Congresses | X-ray microscopes -- Congresses
Contents:
Advances in instrumentation, detection, and methodology -- X-ray optics monochromators and multilayers, focusing optics -- Quantitative and multivariate analysis -- Imaging techniques and image processing -- Applications of nano-, micro-, and surface analysis techniques.
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Dhaka University Science Library General Stacks | Non Fiction | 537.5352 INI (Browse shelf) | Available | A140576 |
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| 537.5352 CUE Elements of X-ray diffraction. | 537.5352 CUE Elements of X-ray diffraction. | 537.5352 HAX X rays and gamma rays | 537.5352 INI X-ray optics and microanalysis : | 537.5352 OVM Mossbauer analysis of the atomic and magnetic structure of alloys / | 537.5352 SIB Beta- and gamma-ray spectroscopy. | 537.5352 SIB Beta- and gamma-ray spectroscopy. |
"All papers have been peer reviewed."
"This book contains peer-reviewed proceeding contributions to the 20th International Congress on X-ray Optics and Microanalysis, ICXOM20, held in Karlsruhe, Germany, from the 15th to the 18th of September 2009"--P. ix.
Includes bibliographical references and index.
Advances in instrumentation, detection, and methodology -- X-ray optics monochromators and multilayers, focusing optics -- Quantitative and multivariate analysis -- Imaging techniques and image processing -- Applications of nano-, micro-, and surface analysis techniques.
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