Modern developments in electron microscopy.
by Siegel, Benjamin M., [from old catalog] [ed.].
Material type: BookPublisher: New York : Academic Press, 1964Description: xii, 432 p. ; 24 cm.Subject(s): Electron microscopyItem type | Current location | Collection | Call number | Status | Date due | Barcode |
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Books | Dhaka University Science Library General Stacks | Non Fiction | 578.15 SIM (Browse shelf) | Available |
Browsing Dhaka University Science Library Shelves , Shelving location: General Stacks , Collection code: Non Fiction Close shelf browser
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578.15 INE Electron microscopy : | 578.15 INE Electron microscopy : | 578.15 MEE Electron microscopy : | 578.15 SIM Modern developments in electron microscopy. | 578.15 WIQ Practical methods in electron microscopy / | 578.15 WIQ Practical methods in electron microscopy / | 578.15 WIQ Practical methods in electron microscopy / |
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