Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /
by Egerton, R. F.
Material type:
BookPublisher: New York : Springer, c2005Description: xii, 202 p. : ill. ; 25 cm.ISBN: 0387258000.Subject(s): Electron microscopyOnline resources: Table of contents | Publisher description
| Item type | Current location | Collection | Call number | Copy number | Status | Date due | Barcode |
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Dhaka University Science Library General Stacks | Non Fiction | 502.825 EGP (Browse shelf) | 1 | Available | 473946 | |
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Books
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Dhaka University Science Library General Stacks | Non Fiction | 502.825 EGP (Browse shelf) | 2 | Available | 473947 |
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| 502.82 VOS Scanning Probe Microscopy : | 502.82 VOS Scanning Probe Microscopy : | 502.82 W753t Theory and practice of scanning optical microscopy / | 502.825 EGP Physical principles of electron microscopy : | 502.825 EGP Physical principles of electron microscopy : | 502.825 FLS Scanning and transmission electron microscopy : | 502.825 FLS Scanning and transmission electron microscopy : |
Includes bibliographical references and index.
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