Semiconductor reliability /
by Shwop, John E [editor.]; Von Alven, William H [editor.]; United States. Advisory Group on Electron Tubes; Aerospace Industries Association of America; Conference on Reliability of Semiconductor Devices (1961 : New York, N.Y.); Conference on Reliability Assurance Techniques for Semiconductor Specifications (1961 : Washington, D.C.).
Material type:
BookPublisher: Elizabeth, N.J. : Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York c1961Description: ix, 309 p.: ill. ; 22 cm.Subject(s): Semiconductors -- Reliability -- Congresses
| Item type | Current location | Collection | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
Books
|
Dhaka University Science Library General Stacks | Non Fiction | 537.622 SHS (Browse shelf) | Available | A20559 |
Browsing Dhaka University Science Library Shelves , Shelving location: General Stacks , Collection code: Non Fiction Close shelf browser
Vol. [1]: Based on the Conference on Reliability of Semiconductor Devices, 1961, sponsored by the Working Group on Semiconductor Devices, Advisory Group on Electron Tubes, Dept. of Defense. Edited by John E. Shwop [and] Harold J. Sullivan.
Vol. 2: Based on the Conference on Reliability Assurance Techniques for Semiconductor Specifications, October 1961, Washington, D.C., sponsored by Aerospace Industries Association [and others] Edited by William H. Von Alven.
There are no comments for this item.